允利實業有限公司

Yunlitek Industrial Co., Ltd.

Product

Test Probe

Yunlitek Industrial specializes in the semiconductor and electronics testing industry, providing customized test fixtures, precision machining, and technical support to ensure product quality and testing performance.

Test Probe

  • Tip size as small as 0.1mm for precise contact with tiny pins and dense circuits
  • Designed with high-conductivity materials for low contact resistance and stable signal transmission
  • Supports high-frequency, high-speed testing with frequency range exceeding 40GHz
  • Proven durability with over 1 million insertion cycles, ensuring high reliability
  • Customizable based on application requirements (e.g., probe length, spring force, structural design) to meet various testing challenges

標籤

類型

Product Description
RF Test Probe
  • Pitch: ≥0.3mm
  • Current: ≥3-5A
  • Low resistance, self-induction, high-wearing feature and self-cleaning
  • Bandwidth: ≥15-40GHz@-1dB
  • Suitable for QFN/DFN & LGA package
RF Test Probe
RF Test Probe
RF Test Probe
  • Pitch: ≥0.3mm
  • Current: ≥3-5A
  • Low resistance, self-induction, high-wearing feature and self-cleaning
  • Bandwidth: ≥15-40GHz@-1dB
  • Suitable for QFN/DFN & LGA package
High Current Test Probe
  • Pitch: ≥300um
  • High Current Rating ≥4-6A
  • Contact stability
  • Kelvin solution is available
  • QFN/DFN application is available
  • Floating base structure is suitable for QFP/SOP package
High Current Test Probe
High Current Test Probe
High Current Test Probe
  • Pitch: ≥300um
  • High Current Rating ≥4-6A
  • Contact stability
  • Kelvin solution is available
  • QFN/DFN application is available
  • Floating base structure is suitable for QFP/SOP package
Coaxial Test Probe
  • Coaxial structure pitch: ≥0.35mm
  • Insert loss S21: 45-80GHz@-1dB
  • Return loss S11: 45-80GHz@-10dB
Coaxial Test Probe
Coaxial Test Probe
Coaxial Test Probe
  • Coaxial structure pitch: ≥0.35mm
  • Insert loss S21: 45-80GHz@-1dB
  • Return loss S11: 45-80GHz@-10dB
Spring Test Probe
  • min. pitch 0.11 mm
  • min. length 1.4 mm
Spring Test Probe
Spring Test Probe
Spring Test Probe
  • min. pitch 0.11 mm
  • min. length 1.4 mm
Elastomer Contactor
  • Pitch: ≥350um
  • Short signal path & low contact resistance: <100mΩ
  • High pin count: ≤9,000 pins
  • Outstanding contact stability
  • No ball damage
Elastomer Contactor
Elastomer Contactor
Elastomer Contactor
  • Pitch: ≥350um
  • Short signal path & low contact resistance: <100mΩ
  • High pin count: ≤9,000 pins
  • Outstanding contact stability
  • No ball damage
Wafer 2D MEMS Pin
  • Pitch: ≥50um
  • CCC: <1500mA
  • High pin count: ≤40,000 pins
  • Life span: TD 500K ~ 1000K
  • True kelvin test available
  • BCF: ≥ 0.7 gf/mil
  • Max OD: 6 mils
  • Tri-temp: -55℃ ~ 175℃
Wafer 2D MEMS Pin
Wafer 2D MEMS Pin
Wafer 2D MEMS Pin
  • Pitch: ≥50um
  • CCC: <1500mA
  • High pin count: ≤40,000 pins
  • Life span: TD 500K ~ 1000K
  • True kelvin test available
  • BCF: ≥ 0.7 gf/mil
  • Max OD: 6 mils
  • Tri-temp: -55℃ ~ 175℃
Wafer Spring Test Probe
  • Pitch: ≥130um
  • Current: ≥0.5-3A
  • Contact stability
  • Kelvin test
Wafer Spring Test Probe
Wafer Spring Test Probe
Wafer Spring Test Probe
  • Pitch: ≥130um
  • Current: ≥0.5-3A
  • Contact stability
  • Kelvin test
FAQ

Frequently Asked Questions

Yunlitek has compiled information on the application range, technical specifications, and usage methods of Test Probe, helping you quickly understand product performance and the advantages of flexible testing. For additional needs, please feel free to contact us for further technical support.
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About

Since its establishment in 2014, Yunlitek Industrial Co., Ltd. has been committed to delivering efficient and precise test consumables and semiconductor testing solutions.

We focus on the research and development of testing technologies, including IC test sockets, CMOS sensor testing platforms, and PCB test fixtures. Our high-quality products and services are trusted by IC design houses, testing labs, module manufacturers, and system integrators.

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